[IEEE EMC Distinguished Lecture] How Close Can Far-Field Be? Getting the Best Out of Your Measurement Range
June 2 @ 3:00 pm - 4:00 pm
Please join us for an upcoming lecture on 2 June 2025 at 3 – 4 pm (Eastern Time) by Dr. Benoit Derat, Senior Director for Systems Developments and Project Implementations, at Rohde & Schwarz, Munich, <a href="http://Germany.
Date:” target=”_blank” title=”Germany.
Date:”>Germany.
Date: Monday, 2 June 2025
Time: 3:00 PM to 4:00 PM (EST)
Location: Room BA 2135, Bahen Centre for Information Technology, 40 St George St, Toronto
How Close Can Far-Field Be? Getting the Best Out of Your Measurement Range
Trends in modern wireless communications, including the use of massive MIMO and millimeter wave frequencies, have supported an increased deployment of electrically large antennas. This created technical and economic challenges as many EMC or regulatory tests require a far-field condition. This talk provides an overview of the recent findings in defining the shortest possible far-field test distance, depending on the size of the device under test, its operation frequency, the target metric and the upper bound acceptable measurement deviation. Practical ways are also described to determine the maximum antenna aperture size that can be tested in the far-field at a given frequency and for a maximum error, in an existing chamber with a defined range <a href="http://length.
Speaker(s):” target=”_blank” title=”length.
Speaker(s):”>length.
Speaker(s): Benoit Derat
Room: BA 2135, Bldg: Bahen Centre for Information Technology, 40 St George Street, Toronto, Ontario, Canada, M5S 2E4