[IEEE CAS04/ED15/EP21/PHO36 EDS Distinguished Lecture] Reliability Topics for the Miniaturization and Qualification of Advanced Silicon CMOS Technologies
June 25 @ 10:00 am - 11:00 am
IEEE Electronic Packaging Society Toronto is proud to invite you to a virtual distinguished lecture by Dr. Fernando Guarin of <a href="http://GlobalFoundries.
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Join us Monday, 25 June 2026 at 10AM (ET)
Abstract
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Up to this point in the evolution of leading-edge Silicon CMOS technologies the qualification of the latest nodes has been carried out using the methods and targets dictated by digital/logic applications. For RF applications digital centric methodology and metrics will no longer be applicable. We will discuss the reliability impact of miniaturization and the qualification activities driven by the need to support reliable operation for RF circuit applications. The CMOS solutions for RF applications include the introduction of SOI that may introduce additional reliability considerations. The path to maintaining the advanced CMOS scaling cadence and new reliability limiting factors will be examined from the reliability perspective. We will also review the reliability requirements for RF reliability devices and applications as we prepare to introduce technologies to serve the 5G infrastructure requirements. A closer look will be given to Hot Carriers. The characterization, models and qualification methodologies will be put in the required perspective for the successful qualification and transfer of leading-edge technologies to a manufacturing <a href="http://environment.
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Speaker(s): Dr.Fernando Guarin,