IEEE Toronto Section is pleased to announce a DL day, which brings together distinguished lecturers from the IEEE Communications Society (ComSoc), Signal Processing Society (SPS), and Vehicular Technology Society (VTS) in a single event. This offers attendees an unparalleled opportunity to engage with renowned professionals who are at the forefront of innovation in their respective <a href="http://fields.​The" target="_blank" title="fields.​The">fields.​The event will feature cutting-edge talks on topics such as multilayer networks, self-supervised Wi-Fi sensing, semantic communications with diffusion models, digital twin networks for vehicle platoons, pervasive intelligence in 6G systems, and emerging cybersecurity threats with current state-of-the-art <a href="http://defenses.​Join" target="_blank" title="defenses.​Join">defenses.​Join us for a day filled with insightful talks, engaging discussions, and valuable networking opportunities. Whether you're a graduate student, young researcher, or industry professional, this event offers new perspectives on the latest advancements in the <a href="http://field.Please" target="_blank" title="field.Please">field.Please complete a FREE registration before May 25 at vTools to reserve your lunch and coffee/<a href="http://refreshments.Agenda:">refreshments.Room: ENG-LG02, Bldg: George Vari Engineering and Computing Centre, Toronto Metropolitan University, 245 Church Street, Toronto , Ontario, Canada

Please join us for an upcoming lecture on 2 June 2025 at 3 – 4 pm (Eastern Time) by Dr. Benoit Derat, Senior Director for Systems Developments and Project Implementations, at Rohde & Schwarz, Munich, <a href="http://Germany.Date:" target="_blank" title="Germany.Date:">Germany.Date: Monday, 2 June 2025Time: 3:00 PM to 4:00 PM (EST)Location: Room BA 2135, Bahen Centre for Information Technology, 40 St George St, TorontoHow Close Can Far-Field Be? Getting the Best Out of Your Measurement RangeTrends in modern wireless communications, including the use of massive MIMO and millimeter wave frequencies, have supported an increased deployment of electrically large antennas. This created technical and economic challenges as many EMC or regulatory tests require a far-field condition. This talk provides an overview of the recent findings in defining the shortest possible far-field test distance, depending on the size of the device under test, its operation frequency, the target metric and the upper bound acceptable measurement deviation. Practical ways are also described to determine the maximum antenna aperture size that can be tested in the far-field at a given frequency and for a maximum error, in an existing chamber with a defined range <a href="http://length.Speaker(s):" target="_blank" title="length.Speaker(s):">length.Speaker(s): Benoit DeratRoom: BA 2135, Bldg: Bahen Centre for Information Technology, 40 St George Street, Toronto, Ontario, Canada, M5S 2E4