TBDCo-sponsored by: Abedal Rahman ShehabiSpeaker(s): Dr. SiddiquiRoom: 314, Bldg: Walter Light Hall, 19 Union St, Kingston, Ontario, Canada

This session provides a technical overview of tradeoffs in the use of precision, multi-lane millimeter-wave test fixtures for empirical characterization of 200G and 400G silicon SerDes. Measurement data from 67 GHz and 110 GHz channel emulators are analyzed, with emphasis on the impact of higher order modes in coaxial test cables relative to 200G and 400G Nyquist frequencies. For 224G SerDes, results demonstrate the ability to trade test cable loss at Nyquist against modal bandwidth, maintaining at least 20% BW margin. The discussion extends to candidate signaling strategies for 400G, evaluating whether these trends persist as modulation formats and channel requirements evolve. The findings inform the design and validation of next-generation serial PHYs, highlighting physical layer constraints and opportunities for advancing high-speed data center <a href="http://interconnects.Speaker(s):" target="_blank" title="interconnects.Speaker(s):">interconnects.Speaker(s): Andrew Josephson, Virtual: https://events.vtools.ieee.org/m/505970